{"id":1947,"date":"2023-06-04T14:05:04","date_gmt":"2023-06-04T14:05:04","guid":{"rendered":"https:\/\/www.jys-ims.com.tw\/?post_type=products&#038;p=1947"},"modified":"2025-08-10T08:43:27","modified_gmt":"2025-08-10T08:43:27","slug":"p5_02","status":"publish","type":"products","link":"https:\/\/www.jys-ims.com.tw\/en\/products\/p5_02\/","title":{"rendered":"German OPM WLI white light interferometer"},"content":{"rendered":"<p><span style=\"font-weight: 400\">German-made OPM white light interferometer<\/span><\/p>\n<p>Suitable for non-contact measurement of micro-nanostructured surfaces, especially transparent surface materials<\/p>\n<p>Film thickness difference (2D\/3D), X, Y, Z fine dimension measurement<\/p>\n<p>Can be used as OEM components and can be used with automated measurement equipment for wafer height, roughness, and defects<\/p>","protected":false},"featured_media":1949,"template":"","product_category":[22],"class_list":["post-1947","products","type-products","status-publish","has-post-thumbnail","hentry","product_category-wli"],"acf":[],"_links":{"self":[{"href":"https:\/\/www.jys-ims.com.tw\/en\/wp-json\/wp\/v2\/products\/1947","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.jys-ims.com.tw\/en\/wp-json\/wp\/v2\/products"}],"about":[{"href":"https:\/\/www.jys-ims.com.tw\/en\/wp-json\/wp\/v2\/types\/products"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.jys-ims.com.tw\/en\/wp-json\/wp\/v2\/media\/1949"}],"wp:attachment":[{"href":"https:\/\/www.jys-ims.com.tw\/en\/wp-json\/wp\/v2\/media?parent=1947"}],"wp:term":[{"taxonomy":"product_category","embeddable":true,"href":"https:\/\/www.jys-ims.com.tw\/en\/wp-json\/wp\/v2\/product_category?post=1947"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}