{"id":5022,"date":"2020-08-14T09:55:42","date_gmt":"2020-08-14T09:55:42","guid":{"rendered":"https:\/\/www.jys-ims.com.tw\/?post_type=products&p=5022"},"modified":"2024-09-14T11:39:24","modified_gmt":"2024-09-14T11:39:24","slug":"aoimappingsys","status":"publish","type":"products","link":"https:\/\/www.jys-ims.com.tw\/en\/products\/aoimappingsys\/","title":{"rendered":"AOI image stitching analysis and measurement system"},"content":{"rendered":"

\"\"<\/p>\n

Image processing for various products<\/p>\n

Use high-speed computing algorithms to process the size measurement and defect determination of the object to be measured<\/p>\n

Used in semiconductor industry, optoelectronics, biomedicine and industrial industries<\/p>\n

Provide suitable industrial automation detection solutions<\/p>","protected":false},"featured_media":5028,"template":"","product_category":[27],"class_list":["post-5022","products","type-products","status-publish","has-post-thumbnail","hentry","product_category-metallographic-analysis"],"acf":[],"_links":{"self":[{"href":"https:\/\/www.jys-ims.com.tw\/en\/wp-json\/wp\/v2\/products\/5022","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.jys-ims.com.tw\/en\/wp-json\/wp\/v2\/products"}],"about":[{"href":"https:\/\/www.jys-ims.com.tw\/en\/wp-json\/wp\/v2\/types\/products"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.jys-ims.com.tw\/en\/wp-json\/wp\/v2\/media\/5028"}],"wp:attachment":[{"href":"https:\/\/www.jys-ims.com.tw\/en\/wp-json\/wp\/v2\/media?parent=5022"}],"wp:term":[{"taxonomy":"product_category","embeddable":true,"href":"https:\/\/www.jys-ims.com.tw\/en\/wp-json\/wp\/v2\/product_category?post=5022"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}