{"id":6400,"date":"2020-04-16T17:14:44","date_gmt":"2020-04-16T09:14:44","guid":{"rendered":"https:\/\/www.jys-ims.com.tw\/?post_type=products&#038;p=6400"},"modified":"2026-11-06T18:22:47","modified_gmt":"2026-11-06T10:22:47","slug":"swircamera-semicon","status":"publish","type":"products","link":"https:\/\/www.jys-ims.com.tw\/en\/products\/swircamera-semicon\/","title":{"rendered":"SWIR infrared microscopy"},"content":{"rendered":"<p>Industrial Microscopes and Infrared Cameras | Semiconductor Silicon Wafer Inspection<\/p>\n<p>Suitable for observation and non-destructive testing of the internal structure of semiconductor silicon wafers<\/p>\n<p>Can be used with industrial microscopes and IR objectives<\/p>\n<p>It provides clear infrared images to meet the testing needs of semiconductors and precision materials.<\/p>","protected":false},"featured_media":6402,"template":"","product_category":[24],"class_list":["post-6400","products","type-products","status-publish","has-post-thumbnail","hentry","product_category-industrial-camera"],"acf":[],"_links":{"self":[{"href":"https:\/\/www.jys-ims.com.tw\/en\/wp-json\/wp\/v2\/products\/6400","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.jys-ims.com.tw\/en\/wp-json\/wp\/v2\/products"}],"about":[{"href":"https:\/\/www.jys-ims.com.tw\/en\/wp-json\/wp\/v2\/types\/products"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.jys-ims.com.tw\/en\/wp-json\/wp\/v2\/media\/6402"}],"wp:attachment":[{"href":"https:\/\/www.jys-ims.com.tw\/en\/wp-json\/wp\/v2\/media?parent=6400"}],"wp:term":[{"taxonomy":"product_category","embeddable":true,"href":"https:\/\/www.jys-ims.com.tw\/en\/wp-json\/wp\/v2\/product_category?post=6400"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}