Microscope modified with white light interferometer module

1. Available on Olympus, Nikon, Leica and other metallographic/tool microscopes.
White light interference sensing elements are installed on the lens and C-mount. It is upgraded to a 3D white light interference measuring instrument.
2.Light source: high brightness photoelectric tube 505nm
3.CCD analysis: Standard: 780×582 pixels, 48fps (Wire Fire)/Optional: 1280×1024 pixels, 169 fps (USB3)
4. Z-axis measurement range: 100, 400um optional
5.XY measurement area: Depends on the lens
6.Z-axis measurement accuracy: Depends on the installation of interference objective lens and measurement range
5X objective lens: 1nm /10X objective lens: 1nm/ 20X objective lens: 0.3nm/ 50X objective lens: 0.3nm/ 100X objective lens: 0.1nm (the above is 400um)
7.Software functions: microstructure profile, surface roughness, coating thickness
2D and 3D dimensions and image display, report output function.
8. Optional: XY electric platform, puzzle software stitching function
9. Optional: XYZ electric platform, fully automatic measurement function
10. Optional: Active anti-shock table (pictured)

You can purchase the advanced version of the software to export the scanned and synthesized reports with one click

3D image, 3D profile, automatic capture of the highest and lowest Z-axis surface structure heights, Sa surface roughness (or line roughness Ra)