German OPM WLI white light interferometer

The German-made OPM white light interferometer is suitable for non-contact measurement of micro- and nanostructured surfaces, especially for transparent surface material thickness differences (2D/3D), X, […]

German OPM conjugate focus + white light interferometry

The German OPM white light interferometer + conjugate focus (two-in-one machine) microscopic surface non-contact measurement optical profiler can be equipped with up to six lenses and can be installed on any surface defect […]